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CSR Issue Jan-Feb 2021
Chip Scale Review
January February 2021
Volume 25, Number 1

Cover image represents bare die on a wafer. These die were used in the assembly of a MEMS package, which was integrated into a pressure sensor. MEMS are responsible for the sensing element of heterogeneous integration and are one of many application types that will advance tremendously by leveraging intricate multi-die designs to deliver greater performance in a more compact footprint.

Photo courtesy of Universal Instruments

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