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trench decoupling capacitors on a silicon   communication protocols have eluded us   me well. I also wish to acknowledge
        interposer. (We did not call it 2.5D, which   so far. Perhaps, protocol translator dielets   DARPA, SRC, SEMI, NSF, NIST, the
        later became the abominable terminology   offer a pathway.            UCLA CHIPS Consortium members,
        that should be banned, in my opinion.)   There are many issues that I have not   and the UC system, who have generously
        This work was presented at the now-  talked about here, but which are very   sustained our work. This article is an
        defunct 3D ASIP conference in 2013 along   important. One issue is that many of   abridged version of the short course I
        with a product announcement. Since then,   these advanced packages do not allow for   gave at IEDM 2022.
        the industry has focused on large processor   rework, therefore, redundancy and self-
        dies connected at ~40-50μm solder bump   repair are going to be important. (We   References
        pitch to stacked memory dies via a silicon   have proposed the use of utility dielets   1.  S. S. Iye r, “ He t e r oge n e ou s
        interposer. This is a good development   to perform these and other functions.)   i nteg rat ion for perfor mance
        that has driven the artificial intelligence/   Another issue is thermal: as we bring the   and scaling,” IEEE Trans. on
        machine learning (AI/ML) applications.  dies closer, there is no space to spread   Components, Packaging and
          Heterogeneous integration, however, is   heat laterally so the heat needs to be   Manufacturing Tech., vol. 6, no. 7,
        a lot more than a memory and processor   extracted vertically. Additionally, power   pp. 973-982, July 2016.
        chip tied together! Additionally, 500-  delivery is a challenge. There is active   2.  S. S. Iyer, S. Jangam, B. Vaisband,
              2
        836mm  dies are not chiplets or dielets   work going on in these areas and steady,   “Silicon interconnect fabric: A
        either! We need to have a commercially-  incremental progress is being made for us   versatile heterogeneous integration
        viable roadmap that reduces “bump”   to be optimistic.                     platform for AI systems,” in IBM
        pitch, trace/wiring pitch, reduces dielet/                                 Jour. of Research and Development,
        chiplet size and inter-dielet spacing, so   Summary                        vol. 63, no. 6, pp. 5:1-5:16, 1 Nov.-
        that dies can butt together on an extremely   To summarize, fine-pitch heterogeneous   Dec. 2019.
        planar substrate. All these are  difficult   integration of a wide variety of small   3.  S. Jangam, S. S. Iyer, “Silicon-
        engineering problems, but well within   dielets offers a path to reduced size,   Interconnect fabric for fine-pitch
        the capability of the microelectronics   lower power, and potentially lower cost   (≤10μm) heterogeneous integration,”
        industry. Heterogeneous integration with   at the functional system level. It’s no   IEEE Trans. on Components,
        diversely-sourced dielets presents unique   longer about shrinking transistors, but   Packaging and Manufacturing Tech.,
        supply chain and trust challenges. For   more about miniaturizing systems with   vol. 11, no. 5, pp. 727-738, May 2021,
        example, if you design a chip/chiplet, the   a diversity of components—not just   doi: 10.1109/TCPMT.2021.3075219.
        foundry manufactures and delivers dies or   transistors! The heterogeneous integration   4.  S. S. Nagi, et al., “A 16nm 784-
        dielets, and when singly-packaged, we call   roadmap and its allied manufacturing   core digital signal processor
        it a chip. When many chips are packaged   roadmap, the Manufacturing Roadmap for   array, assembled as a 2 × 2 dielet
        together, however, we call it a module. All   Heterogeneous Integration and Packaging   w it h  10μ m  pitch  i nterd ielet
        this calls for an independent packaging   (MRHIEP) provide valuable guidance   I/O for runtime multi-program
        and test facility that can deal with   as we embark on the post-Moore’s Law   reconfiguration,” IEEE Jour. of
        multiple fabs, multiple nodes, multiple   era. But the message is clear: feature   Solid-State Circuits, vol. 58, no. 1,
        material systems, and the like, and an   scale down and system scale out. We   pp. 111-123, Jan. 2023, doi: 10.1109/
        immensely trustworthy relationship with    will also need a more rigorous design   JSSC.2022.3212685.
        multiple fabs.                     methodology that borrows concepts,   5.  ht t p: // w w w.b e t a si g ht s . n e t /
          Today, there is no dielet marketplace   such as process design kits (PDKs) from   wordpress/?p=1216
        (other than perhaps high-bandwidth   silicon, and a predictable scaling roadmap   6.  C .  H o r n b u c k l e ,  S .  S .  Iye r,
        memories [HBMs]—and try getting    for packaging.                          “Passive silicon inter posers
        those!). We need to have a dielet                                          with deep trench decoupling for
        discovery system based on aggregated   Acknowledgments                     heterogeneous integration of
        IP that are selected and fabricated using   I would like to thank the many   disparate technologies,”  3DASIP
        a statistical usage model (e.g., which IPs   colleagues in industry and academia   presentation, Dec. 2013. The charts
        occur together and how often they are   who have been generous in teaching   that were presented are available
        used). This is going to require a lot of   me about packaging (I am a relative   from the author.
        cooperation, transparency, and perhaps   latecomer to this field), my students, who
        some I/P standardization. Universal   unbeknownst to them, have also taught


                       Biography
                         Subramanian S. Iyer (Subu) is Distinguished Professor and holds the Charles P. Reames Endowed Chair
                       in the Electrical Engineering Department and a joint appointment in the Materials Science and Engineering
                       Department at the University of California at Los Angeles. He is Director of the Center for Heterogeneous
                       Integration and Performance Scaling (UCLA CHIPS). He is a fellow of IEEE, APS, iMAPS and NAI, as well
                       as a Distinguished Lecturer of IEEE EDS and EPS. He is a Distinguished Alumnus of IIT Bombay. He received
                       the IEEE Daniel Noble Medal for Emerging Technologies in 2012, and the 2020 iMAPS Daniel C. Hughes Jr.
                       Memorial award, and the iMAPS Distinguished Educator Award in 2021. Email s.s.iyer@ucla.edu


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