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Eliminating warpage for FOWLP during debonding
By Debbie Claire Sanchez, Klemens Reitinger, Miguel Adolfo Resendiz Jimenez,
Sophia Oldeide, Kang Zhao, Wenxuan Song, Ibrahim Khwaja [ERS electronic GmbH]
T he increasing demand for panel with RDL is then debonded from Die bonding. The process starts with
smaller a nd more cost-
efficient packaging in the the carrier. The process then moves the picking of known good dies (KGD)
from a sawn silicon wafer, which are
to back-end processing. Solder balls
portable electronic area has increased are placed on top of the RDLs, which then placed onto a temporary carrier
the discussion about fan-out wafer- serve as an electrical conduit between laminated with a thermal or ultraviolet
level packaging (FOWLP). Advantages the dies and board. (UV) sensitive tape.
of FOWLP technology include: 1) Good The chip-first process (Figure 1) is Molding. The compression molding
electrical performance; 2) Supporting more widely used by companies like process is commonly used for this
increasing demands for I/O count; 3) Infineon, ASE, and Deca Technologies, structure. It starts with weighing the
Enabling dual-die or multi-die package right amount of EMC and dispensing
configuration; and 4) Providing a it on top of the carrier. The machine
supporting fine redistribution layer then starts closing the cavity in a
( R DL) t races ≤10µm li ne/space. controlled speed.
Alongside the mass production, two D e b o nd i n g. T h e d e b o n d i ng
critical issues surfaced for FOWLP: process is t he se pa r at ion of t he
die shift and wafer warpage. reconstituted wafer from the carrier,
Die shift results from misplacement via the application of heat, or laser
of the die with regards to its designed exposure. The sensitive (thermal or
posit ion. Wa r page is due to t he UV) tape layer softens and loosens
mismatch of the coefficient of thermal adhesion to aid separation of the wafer
expansion (CTE) between silicon from the carrier. Once the wafer is
and the epoxy molding compound separated from the carrier material,
(EMC). EMC, having a higher CTE any characteristic imbalance will be
value, results in an imbalance, which evident, leading to warpage. Warpage
will cause the wafer or panel to appears on account of mechanical
warp. Applying the correct thermal stress caused by the CTE mismatch of
treatment process, however, results in the reconstituted wafer.
a warpage profile <1mm, which allows For a thermal debonding process,
succeeding processes to run smoothly. ther mal unifor mit y is cr itical to
The idea is to treat the wafer with a ensure no wafer excursion occurs.
temperature higher or equal to its Tg The thermal sensitive tape needs to
until the mold compound softens, and activate across the entire surface
then transport it onto a cooler chuck. before mechanical separation of the
As the wafer sits on the cool vacuum carrier and the wafer. At this point,
chuck, it conforms to its flatness. The the warpage becomes evident. In the
transportation from the debonding chip-first structure, this process is
station to the cooling chuck plays a the launching pad for interconnect
significant role, requiring several build-up. If warpage is not reduced,
critical items. w a r p a g e -i n d u c e d d ef e c t s w i l l
increase as the wafer goes through
Types of fan-out structures Figure 1: Chip-last and chip-first structures. the line.
There are two process flows for fan- Photo, plating, etching processes.
out structures: chip-last and chip-first. and has a reverse order compared to With the RDL built into the chip or
The chip-last process is depicted in the chip-last process flow. The process carrier, the wafer or panel is now
Figure 1, beginning with the building starts with die bonding, molding, ready for f inal wafer processing
of the RDLs onto a temporary carrier debonding, and then RDL processing, involving ball drop, wafer thinning,
followed by the die bonding process respectively. Details of the process are laser marking, singulation, and tape
and molding. The reconstructed wafer/ explained in the following sections. and reel.
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