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in series to the ATE measurement
instrument. A parallel measurement
approach is also possible, but requires
eight ATE measurement instruments.
The optimal setup will depend on a
detailed cost of test analysis.
Summary
For OTA testing with ATE of AiP
modules, there is no right or wrong answer.
Depending on the testing requirements
and on the testing stage (for example, Figure 8: Example of a reactive near-field probing prototype socket for demonstration of the concept on a 2x2
initial ramp up or mature high-volume patch antenna array.

Table 1: Comparison of the different ATE OTA testing methodologies.
manufacturing), the OTA test strategy and Frank Goh from Advantest for their J. Moreira, H. Takasu, “Socket
might be different. Table 1 shows a high- support and collaboration on the OTA design and handler integration
level comparison of the different OTA test project development. We would like also challenges in over the air testing for
strategies presented on this paper. to thank Prof. Jan Hesselbarth from the 5G applications,” To be presented at
In a future follow-up paper we will use a University of Stuttgart. TestConX 2020, May 2020.
custom-designed 28GHz 2x2 path antenna 4. J. Hesselbarth, G. Sterzl, J. Moreira,
array in a 0.4mm ball grid array (BGA) pitch References “Probing millimeter-wave antennas
package to compare the different approaches 1. C. Par ini, et al., Theor y and and arrays in their reactive near field,”
in terms of OTA measurement results Practice of Modern Antenna Range 49th Euro. Microwave Conf., 2019.
with the Advantest V93000 Wavescale Measurement, IET, 2014. 5. U. Dey, J. Hesselbarth, J. Moreira,
Millimeter CardCage ATE system. 2. J. Moreira, J. Hesselbarth, K. K. Dabrowiecki, “Over-the-air test
Dabrowiecki, “Challenges of over of dipole and patch antenna arrays
Acknowledgements the air (OTA) testing with ATE,” at 28GHz by probing them in the
We would like to thank Natsuki TestConX China, Shanghai, Oct. 29, reactive near field,” To be presented
Shiota, Aritomo Kikuchi, Hiromitsu 2019. at 95th ARFTG Microwave Meas.
Takasu, Hiroyuki Mineo, Sui-Xia Yang, 3. N. Shiota, A. Kikuchi, H. Mineo, Conf., 2020.

Biography
Jose Moreira is a Senior R&D Staff Engineer at Advantest in Böblingen, Germany. He focuses on testing
high-speed digital, silicon photonics, and 5G mmWave devices and holds an MS degree in Electrical and
Computer Engineering from the Instituto Superior Técnico, Lisbon U., Portugal. He is a senior member of
the IEEE, technical member of the IEEE P370 standard and co-author of the book An Engineer’s Guide to
Automated Testing of High-Speed Digital Interfaces. Email jose.moreira@advantest.com

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