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Figure 5: Impact of the measurement antenna on the DUT AiP antenna elements in a radiating near-field measurement.
        assume that there would be some    a n t e n n a i s u s e d ,
        easy correlation between good AiP   depending on the DUT
        modules  tested  in  a  far-field  setup   A i P anten na a r ray
        with failing AiP modules tested on a   geometry, the distance
        near-field setup, assuming of course a   of each DUT antenna
        comprehensive list of performed tests.   array element to the
        This is a valid thinking, but one needs   measurement antenna
        to be aware of two important drawbacks   will be different. This
        on a radiating near-field measurement   can have a significant
        setup. The first is that the measurement   impact on a worst-
        antenna is now so close to the AiP   c a s e s c e n a r i o a s
        DUT antenna array that it will have   show in [2,3]. Finally,
        an impact on the DUT AiP antenna   c a l ib r a t ion   i n   t h e
        elements (antenna detuning) and can   radiating near-field is
        even result in a standing-wave effect.   not trivial. If golden-
        This is shown with a simple simulation   dev ice cal ibr at ion
        in Figure 5 where two patch antennas   is used, results are
        are simulated with varying distances   critically dependent
        between them. This effect is also easy   on the golden device’s
        to see on a real measurement on an AiP   p e r for m a n c e ,  a n d  Figure 7: Reactive near-field probing concept for patch and dipole antennas.
        module [2,3].                      absolute measurements
          The second drawback is shown in   are not possible.                 parallel needles to probe the electric or
        Figure 6. Because only one measurement                                magnetic field on the DUT AiP reactive
                                           OTA reactive near-field testing    near field. The main advantages are
                                             Another alternative approach for   that each element of the DUT AiP
                                           OTA testing with ATE is to measure   array is individually measured (power
                                           the DUT AiP antenna array in reactive   and phase) and that the probe size is
                                           near field. In this case, a classical   very small to minimize the disturbance
                                           measurement antenna cannot be used   of ea ch r a d iat i ng element. T h is
                                           because in the reactive near-field range   concept is explained in more detail
                                           it would have a dramatic effect on the   in [4,5]. Figure 8 shows an example
                                           DUT AiP antenna elements. To measure   of a prototype reactive near-field
                                           on the reactive near field, the antenna   socket [3]. Note that in the example of
                                           or probing element needs to be very   Figure 8, a dual-polarized 2x2 AiP
                                           small.  Figure  7  shows  one  possible   array is measured resulting in eight
                                           reactive near-field probing concept   individual  sig nals. To  keep ATE
                                           for OTA ATE that has been patented   resources to a minimum (for cost of test
        Figure 6: Impact of the single measurement                            reasons), a solid-state relay switches
        antenna position on the distance to the different   by  Advantest using  two  very thin   each of the antenna/polarization signals
        antenna array elements on an AiP DUT.

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