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Powering chips from the backside
By Naoto Horiguchi, Eric Beyne [imec]
A power delivery network is
designed to provide power
su p p l y a n d r e f e r e n c e
voltage (i.e., V DD and V SS ) to the active
devices on the die most efficiently.
Traditionally, it is realized as a
network of low-resistive metal wires
fabricated through back-end-of-line
(BEOL) processing on the frontside of
the wafer. The power delivery network
shares this space with the signal
network, i.e., the interconnects that
are designed to transport the signal.
To deliver power from the package
to the transistors, electrons traverse
all 15-20 layers of the BEOL stack
through metal wires and vias that get
increasingly narrow (hence, more
resist ive) when approach i ng t he
transistors. On their way, they lose
energy, resulting in a power delivery,
or IR drop, when bringing the power Figure 1: Schematic representation of a traditional frontside power delivery network.
down. When arriving closer to the
transistor, i.e., at the standard cell Promises of a backside power power delivery to the standard cells
level, the electrons end up in V DD and delivery network through wider, less resistive metal
V SS power and ground rails organized A backside power delivery network lines, without the electrons needing
in the M int layer of the BEOL. These (BSPDN) promises to address the to travel through the complex BEOL
rails take up space at the boundary issues noted above (Figure 2). The stack. This approach promises to
and between each standard cell. From idea is to decouple the power delivery benefit the IR drop, improve the power
here, they connect to the source and network from the signal network by delivery performance, reduce routing
drain of each transistor through a moving the entire power distribution congestion in the BEOL, and when
middle-of-line interconnect network network to the backside of the silicon properly designed, allow for further
(Figure 1). wafer, which today serves only as a standard cell height scaling [1].
W i t h e a c h n e w t e c h n o l o g y carrier. From there, it enables direct
generation, the traditional BEOL
architecture described above struggles
to keep pace with the transistor scaling
path. Today, the “power interconnects”
increasingly compete for space in
t he complex BEOL net work a nd
account for at least 20% of the routing
resources. Also, the power and ground
rails take up a considerably large area
at the standard cell level, limiting
further standard cell height scaling.
At the system level, the power density
and IR drop increase dramatically,
challenging designers to maintain
the 10% margin that is allowed for
the power loss between the voltage
regulator and the transistors.
Figure 2: A BSPDN allows for decoupling the power delivery from the signal network.
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