Page 23 - Chip Scale Review_March April_2022-digital
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Visualize the Future of
Advanced CIS Inspection Solution
Accurate Detectability Sensor & Glass Inspection
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High Yield Rate High Resolution for Micro Defect
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INTEKPLUS's CIS inspection solution enables inspection of minor size defects.
We provide advanced 2D/3D quality control required for the next IT movement
in xG and IoT applications, including EV, Drone, Mobile, and so on.
iPIS-340HX
INTEKPLUS CO., LTD.
Visual Technology for Semiconductor Package / Wafer / EV Battery / Display For more information
#263, Techno 2-ro, Yuseong-Gu, Daejeon, 34026 Korea www.intekplus.com
Tel +82-42-930-9900 Fax +82-42-930-9999 sales1@intekplus.com
