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formation. We have confirmed in our A new concept in FOWLP equipment that was indispensable
own studies that stable open and short technology for FOWLP production was installed
yields can be achieved with a 90µm We developed RISPAC to increase in the clean room for use in mass
terminal pitch device. This silicon the added value of our products. production. Our FOWLP technology
body type RDL-1st FOWLP has two O u r FOW LP manufact u r i ng li ne targets the low-density application
options: one for a single device, w a s l a u n c h e d b y u t i l i z i n g L SI field, which has a relatively small
and the other for a dual device in equipment—such legacy equipment number of pins and a small package
which dies are stacked. Both options can be satisfactorily used in FOWLP size. As previously noted, we have two
achieved the required performance manufacturing, contributing to the types of FOWLP: resin body type, and
and reliability in our evaluations. reduction of the early investment in silicon body type.
the line. In addition, a subset of the By using RISPAC technology, our
customers’ device requirements have
been fulfilled. It is possible to reduce
Laser Assisted Bonding the ON resistance of devices, increase
p owe r e f f i c i e n c y, a n d i m p r ove
switching performance (Figure 1).
T he example i ncludes switchi ng
performance improvement in resin-
body type products. We confirmed that
the switching noise can be reduced to
1/10 in the voltage regulator module
with a driver and MOSFET (DrMOS).
On the other hand, our silicon body
type FOWLP also complies with a
variety of customers’ requests and
captures their demands. The silicon
SMD LED b o d y t y p e F OW L P e n a b l e s t h e
• SMD placement on ultra-thin flex • Mini & Micro LED assembly for ultra-small and ultra-thin dies to be
repair and mass transfer mounted on a small and thin package
utilizing the rigidity of the silicon.
Figure 2 shows the package structure
on the silicon body type FOWLP. The
die has been completely encased in
epoxy resin; and electrolytic plating
was used to form the Cu interconnects,
the solder bumps, and the Cu pillars in
the silicon 3D structure. This package
uses flip-chip bonding—its possible
misalignment after chip placement is
VCSEL 2D - 2.5D Packaging corrected by the self-aligning effect
• diode assembly in between • Chip on wafer, chip on board, chip during the reflow process.
cooling block on chip, package on package T h e b a s i c p r o c e s s f l o w
f o r t h e s i l i c o n b o d y t y p e
F O W L P i s ou t l i n e d i n
Figure 3. First, concave pockets are
formed on the silicon substrate by
lithography and wet etching. After
forming the passivation layer, Cu
i ntercon nect s a nd solder bu mps
a r e fo r m e d b y l it hog r a p hy a n d
electrolytic plating. Next, Cu pillars
for external terminals are formed,
3.5D Multilayer Die Stacking 3D Packaging the dies are mounted, and then over-
• Horizontal & vertical chip assembly • In-situ die placement & reflow molding is applied. The tops of the
• No requirement for TSV structures • Lowest thermal & mechanical stress
• Simplification of complex package • High chip stack uniformity Cu pillars are exposed by grinding
design the mold resi n. T he exposed Cu
surface goes through an electroless
plating process for external terminals,
www.pactech.de and the target package thick ness
sales@pactech.de is achieved by grinding the silicon
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42 Chip Scale Review May • June • 2021 [ChipScaleReview.com]