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lower energy consumption. To those
        ends, we are working in the EU-founded
        L3MATRIX and Mass Manufacturing
        of Transceivers for Terabit/s Era
        ( M ASSTA RT ) proje ct s of fe r i ng
        technological innovations in the fields
        of silicon photonics and the integration
        of 3D devices [3-5]. The aim of the
        L3MATRIX project partners is to develop
        a novel matrix with a larger scale than
        any other device, and to integrate more   Figure 3: Dual-sided cooling demonstrator for 3D Si-integration.
        than 100 modulators on a single chip, and   fluidic interposers with up to a 27x27mm    on design modification based on first year
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        laser sources with a logic chip (Figure 2).  footprint (Figure 3).    results, technology scaling from half format
          So today, the main bottleneck to the                                to full format 610mmx305mm , as well
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        realization of next-generation computing                              as the integration of vertical interconnect
        systems for all large, secure data   Chiplets gaining traction        elements (VIE) and passive components.
        applications/industries, including SiP   The increasingly higher costs for   The optimization of single process steps,
        and SoC, is the lack of off-chip/off-core   further node miniaturization in the IC   but also the alignment and optimization
        interconnects with low latency, low power,   manufacturing process will also promote   of the interfaces along the manufacturing
        high bandwidth, and high density. One of   the interconnection of chiplets. This means   flows was an ongoing activity throughout
        the most promising approaches to overcome   that intellectual property (IP) blocks   the entire project. Reference process
        these challenges is the use of photonics.   made in different technology nodes will   flows based on photosensitive dry-film
        This will be key to the introduction of   be combined on an active interposer to   dielectric material and non-photosensitive
        disruptive computing technologies and   reduce cost by increasing the production   materials were developed including a semi-
        photonics-enabled architectures, leading   yield (smaller chips) and reuse across   additive plating (SAP) process. Die shift
        to faster, cheaper, power-efficient, secure,   applications. High-density organic   and warpage control to handle and process
        denser solutions for industrial applications.   substrates with or without embedding   large molded fan-out panels were of key
        Furthermore, generic co-integration   technologies may also be a solution. To   importance, including a smart alignment
        with all building blocks of computing   that end, Fraunhofer IZM started the PLC-  strategy development from assembly to
        technology will be possible, as photonic-  consortium working on different R&D   RDL processing. This enabled successful
        based standard interfaces between building   topics related to high-density embedding   evaluations of newly developed materials
        blocks are introduced and implemented.  technologies in organic substrates [7,8]. A
                                           close coordination between the different   for the PLC partners. In addition to the
        Next-generation computing solutions  R&D thrusts was established to produce   technical progress, a complex cost modeling
                                                                              has been successfully implemented,
                                           assembled panels in order to ensure a
          A solution for next-generation   continuous process flow. A major work   which allowed the cost calculation and
        computing might be that part of the   package in the beginning of the project   analysis to be done with fine granularity of
        computing will migrate down to the   was to collect data about the available   reference applications taking into account
        edge and the node level with substantial   materials provided by the partners. Several   process, material and design options, panel
        advantages such as less required overall   test layouts were designed for process   utilization, and scalability. The development
        bandwidth, less latency, and therefore   development. The implementation and   of the data collection tables has been the
        faster decisions enabling new services, and   improvement of the die shift compensation,   result of a collaborative work with the
        the possibility of sensor fusion. But next-  as well as the warpage and thickness   consortium. Different application scenarios
        generation computing can also be based on   measurement and evaluation, was a joint   have been analyzed, and a comparison
        substantially more efficient architectures   effort necessary for the high-density   between a mold-first and a RDL-first
        that consume fractions of the energy that is   redistribution layer (RDL). For this metal   process flow was calculated.
        needed today. The radical improvement of   routing process, a fusion of wafer-level   Standardization of panel sizes has
        energy consumption of high-performance   (thin-film) processing and printed circuit   been discussed at various public events
        computers (edge and cloud) is, therefore,   board (PCB)-like substrate processing was   and a standardization group has been
        one of the major challenges of next-  developed. Different material setups and   installed within the framework of SEMI
        generation computing.              process combinations were assessed and   with guidance and involvement of Panel
          Creating very fast computing systems,   improved and finally, were successfully   Level Consortium members. Last, but
        overcom i ng the cu r rent memor y   applied to demonstrator packages. The   not least, a couple of high-level events
        bottleneck, and significantly improving   work focus of the first year of the PLC   at major international conferences have
        energy efficiency will require 3D stacking   was to establish and to optimize the entire   been organized by the PLC 1.0. The Panel
        of memories and logic ICs for high-  process chain from assembly via molding   Level Consortium has been widely visible
        bandwidth memories (HBMs) [6]. With   and RDL formation to device singulation on   during the last two years and is considered
        a dual-sided cooling approach, we have   a half format 457mmx229mm   panel. This   as the best consortium on this topic. PLC
                                                                  2
        successfully demonstrated the cooling of a   also included the design of test vehicles and   2.0 will continue the R&D work of PLC
        large 20x20mm  heater die with targeted   demonstrators, as well as first reliability   1.0, but will also focus on some specific
                     2
        672W heat dissipation by newly developed   tests. The focus in the second year was   targets. Additionally, Fraunhofer IZM will

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