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Heterogeneous integration of chiplets technology enabled


        by advanced package architectures, first-level interconnect


        By Nelson Fan, Eric Ng  [ASMPT Limited]
        W            hile leading semiconductor   effects of expensive nodes. To achieve   Various HI package architectures




                     companies continue to
                                           degree of chiplets placement accuracy
                     develop complementary   the required performance, a very high   Over the last decade, various HI package
                                                                              architectures have been developed by
        metal-oxide semiconductor (CMOS)   in a heterogeneously-integrated (HI)   the technology frontrunners including
        scaling under the driving forces of high-  device is being scaled up, and more   wafer foundries, integrated device
        performance computing (HPC) and artificial   advanced FLI interconnect processes are   manufacturers  (IDMs),  outsourced
        intelligence (AI) applications, “More than   being developed. From traditional mass   semiconductor assembly and test
        Moore” has been successfully demonstrated   reflow flip chip (MR-FC) and thermal   suppliers (OSATs), and advanced
        through the heterogeneous integration of   compression bonding (TCB) at 5µm and   substrate houses (Figure 2). These HI
        chiplets (HIC) in various advanced package   2µm placement accuracy respectively,   package architectures can be classified
        architectures, together with advanced   the technology is now evolving towards   into three major basic categories: 1) with
        first-level interconnect (FLI) technologies   fluxless thermal compression bonding   a through-silicon via (TSV) interposer;
        (Figure 1). The objective of developing   with bond accuracy of less than 1µm   2) with a redistribution layer (RDL)
        advanced package architecture is to deliver   to handle the very high bump density   interposer;  and  3)  with  single  and/
        the same or even better device performance   with pitches less than 10µm.  Although   or multiple embedded silicon bridges
        as a system-on-chip (SoC) format while   the ultimate device performance can   (e-bridge) inside the high-density build-
        achieving the best cost of production.  be enabled by the copper-to-copper   up interconnect (HDI) substrate.
                                           connection through the hybrid bonding   Among the three categories mentioned
        FLI process mapping                process, the cost of ownership can   above, the TSV interposer offers the
          Although CMOS scaling is continuing   currently only be borne by devices with   best routing capability with the finest
        to progress at a slower pace, the focus   a very high average selling price (ASP).     line width and spacing at the sub-
        is now on creating chiplets with higher   That being said, hybrid bond technology   micron scale of wafer fabrication feature
        density and I/O counts at a finer pitch   is continuously being developed to target   size. However, it is the most expensive
        (down to sub-micron pitch level)   devices with higher density, better yield,   type and is also limited by its 300mm
        resulting in smaller bump sizes, rather   and an affordable cost of ownership for   diameter manufacturing format. The
        than using SoCs. The HIC approach is   high-volume manufacturing (HVM) in   number of interposers will be very much
        being deployed to mitigate the economic   the near future.            limited per 300mm diameter format,





























        Figure 1: First-level interconnect (FLI) process mapping.

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