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lead-free solders, the linear acceleration   at high temperature (t). A nonlinear
        has been assumed.                  curve fit of the temperature cycling data
          Other acceleration models. It should   of the ceramic ball grid array (CBGA),
        be emphasized that the linear acceleration,   chip scale package (CSP), and thin small   The constants A, B, and C are shown in
        x o  = αx T , is only one form of acceleration.   outline package (TSOP) on a PCB at   Table 1 for three SMDs and test conditions.
        There are many other accelerations,e.g., η   various temperature ranges such as    Linear acceleration factor for
        ≠ 1 and           . More reliability   0   60ºC, 0   100ºC, and -25  125ºC,    Sn3Ag0.5Cu in terms of frequency
        tests should be performed for a variety of   Pan et al., [8] obtained the following   and maximum temperature. For
        IC packages and temperature cycling   l i ne a r  a c c e l e r at i o n  f a c t or  f or   Sn3Ag0.5Cu, some of the researchers
        conditions to establish the suitable   Sn3Ag0.5Cu:                    still use the classical Norris-Lanzberg
        acceleration model [5].                                               acceleration model, i.e., in terms of
                                                                              the cyclic frequency and maximum
        Acceleration factors                                                  temperature during thermal cycling. For
          To  determine  α  (the  acceleration   where t t  and t o  are the dwell time at   PBGA, flip-chip plastic ball grid array
        factor), you need an acceleration   high  temperature,  ∆T t  and ∆T o  are   (fc-PBGA), CBGA, CSP, quad flat pack
        model, which has been discussed in the   the temperature range (in degrees
        previous section. How do you choose   Celsius) during thermal cycling, and
        an acceleration model? The answer is   T max , t   and T max , o  are the maximum
        tests and failure mechanisms, which are   (peak) temperatures (in degrees Kelvin)
        discussed below.                   at tained during ther mal cycling,
          Well-known  linear  acceleration   respectively under testing conditions and
        factor for SnPb based on frequency   under operating conditions. It should be
        and maximum temperature. For SnPb   noted that the effect of dwell time on the
        solder joints, the following Norris-  acceleration factor is (t t /t o ). Because t o
        Landzberg linear acceleration factor   (operating dwell) is usually longer than
        (Equation (2.68) of [4]), has been   t t  (testing dwell), that means that for a
        frequently used:                                                                                                                         positive power, (t t /t o ) is a deceleration
                                           factor. This is just like the effect of (f o /
                                           f t ) in the classical Norris-Landzberg
                                           equation; usually f t  (testing frequency) is
                                           larger than f o  (operating frequency).  Table 2: The constants a, b, and c for various lead-
                                                                              free solders in the linear acceleration factor based on
          In this equation, T T , f T , ΔT T , and T o ,    As an example based on the above   frequency and mean temperature.
        f o , ΔT o , are the maximum temperature   discussion, consider the test conditions
        during cycling (in degrees Kelvin), the   are: 0  100ºC with the dwell time at   (QFP), flip-chip, etc. with test conditions
        temperature cycling frequency, and the   high temperature = 15 minutes and the   such as ∆T = 135ºC and ∆T = 180ºC, Lall
        temperature range (in degrees Celsius),   operating conditions are: 20  70ºC   et al., [10] obtained the following linear
        respectively, at the testing conditions   with the dwell time at high temperature   acceleration factor for Sn3Ag0.5Cu:
        and at operating conditions. For SnPb   = 720 m i nut e s. T he n t he l i ne a r
        solders, q = 1/3, and c = 1.9 ~ 2.0 have   acceleration factor is:
        been used.
          Linear acceleration factor for
        Sn3Ag0.5Cu in terms of dwell time                                       For example, in the thermal cycling
        and maximum temperature. For                                          t e s t  o f  t he  f a n - o ut  l e a d - f r e e
        Sn3Ag0.5Cu, Pan et al., [8] proposed a   For other surface mount devices (SMDs)   (Sn3Ag0.5Cu) package of the 10mm x
        modification of the classical Norris-  and test conditions, Miremadi, et al., [9]   10mm chip, the test conditions are -40
        Landzberg equation by replacing the   obtained the following linear acceleration   85ºC with 24 cycles per day, and we
        cyclic frequency (f) with the dwell time   factor with Sn3Ag0.5Cu solder alloy:  know that the product can survive 280
                                                                              cycles. However, we also need to know if
                                                                              this value of 280 cycles is sufficient to
                                                                              meet the 5-year operating condition
                                                                              given by 20   60ºC with 1 cycle per day
                                                                              (see the calculations below).



                                                                                The product with SAC305 will survive
                                                                              13.79 x 280 cycles per day = 3861 ÷ 365 =
                                                                              10.5 years > 5 years.
                                                                                Linear acceleration factor for
        Table 1: The constants A, B, and C for Sn3Ag0.5Cu tested in various SMDs and conditions in the linear   Sn3Ag0.5Cu  and  other  lead-free
        acceleration factor based on dwell-time and maximum temperature.

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