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for the next generation of heterogeneous
                                                                              integration packages and future imaging
                                                                              and process studies.
          Ball Placement & Laser Soldering
                                                                              Acknowledgements
                                                                                The author would like to thank Timothy
                                                                              Chang, Casey Donaher, Perry Banks and
                                                                              Aries Peng for their assistance with this
                                                                              article. In addition, he would like to thank
                                                                              John Kennedy, Zhiyang Li, Karie Li and
                                                                              Andrew To for their work on the software
                                                                              algorithm, and Tom Swarbrick, Corey Shay,
                                                                              Ryan Tsai and Hans Lin for their support
                                                                              with the lithography work. The author
                                                                              would also like to thank all of his teammates
             3D Soldering                     BGA Soldering                   on the X500 project for their support.
                                                                              References
                                                                                1.  J. Chang, K. Best, J. Lu, B. Ali, M.
                                                                                  Marshall, “Adaptive shot technology
                                                                                  to address severe lithography
                                                                                  challenges for advanced FOPLP,”
                                                                                  pp.: 918-923, ECTC, 2020.
                                                                                2.  K. Best, J. Chang, M. Marshall, J.
                                                                                  Lu, “FOPLP lithography solutions
                                                                                  to overcome die placement error,
                                                                                  predict yield, increase throughput
                                                                                  and reduce cost,” International
             Presoldering of SMD              Lid Sealing for Connectors          Wafer-Level Packaging Conf.
             Connector Elements               & IR Sensors                        (IWLPC), 2019.
                                                                                3.  K. Best, M. Marshall, “Advanced
                                                                                  p a c k a g i ng m e t r o l o g y a n d
                                                                                  lithography that overcomes FOWLP/
                                                                                  FOPLP die placement er ror,”
                                                                                  IWLPC, 2018.
                                                                                4.  K. Ruhmer, “Lithography challenges
                                                                                  for 2.5D interposer manufacturing,”
                                                                                  pp.: 523-527, ECTC 2014.
                                                                                5.  R. McCleary, “Panel-Level advanced
                                                                                  packaging,” ECTC 2016.
             Optoelectronics Device Assembly  Through Hole Technology           6.  K. Ruhmer, P. Cochet, R. McCleary,
                                              Soldering                           “Panel-based fan-out packaging to
                                                                                  reduce costs,” SMTA/Chip Scale
                                                                                  Review IWLPC, Nov. 11-13, 2014.
                                                                                7.  K. Ruhmer, P. Cochet, R. McCleary,
                                                                                  N . C h e n , “ H i g h - r e s o l u t i o n
                                                                                  patterning technology to enable
                                              www.pactech.de                      panel-based advanced packaging,”
                                              sales@pactech.de                    pp.: 129-136, IMAPS 2014, Oct. 13-
                                                                                  16, 2014.



                       Biography
                         John Chang is a Sr. Applications Engineer at Onto Innovation, Hsinchu, Taiwan. He has a MS degree in
                       Nanoelectronics and Photonics from National Chung Hsing U., and he has more than 19 years of experience in
                       advanced packaging. Email: John.Chang@ontoinnovation.com.






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