Page 5 - ChipScale_Nov-Dec_2020-digital
P. 5

The Future of Semiconductor Packaging


      STAFF                                                                              Volume 24, Number 6
      Kim Newman Publisher                                                         November • December 2020
      knewman@chipscalereview.com
      Lawrence Michaels Managing Director/Editor
      lmichaels@chipscalereview.com
      Debra Vogler Senior Technical Editor      FEATURE ARTICLES          (continued)
      dvogler@chipscalereview.com
 LITHOSCALE ®  CONTRIBUTING EDITORS          25   Chip-scale power transistor packaging
      Steffen Kröhnert - Advanced Packaging
                                                  By Shaun Bowers
      steffen.kroehnert@espat-consulting.com
                                                  [Amkor Technology, Inc.]
      John L. Lau, Ph.D - Advanced Packaging
      john_lau@unimicron.com
 MLE™ Maskless Exposure  Ephraim Suhir, Ph.D - Reliability
 Lithography System  suhire@aol.com          31   Testing AiP modules in high-volume
      Rao R. Tummala, Ph.D - Advanced Packaging
      rao.tummala@ece.gatech.edu                  production for 5G applications
                                                  By Jose Moreira
      EDITORIAL ADVISORS                          [Advantest]
      Andy Mackie, Ph.D (Chair) - Indium Corporation
      Rolf Aschenbrenner, Dipl.-Phys. - Fraunhofer IZM
      Arun Gowda, Ph.D - GE Global Research
      John Lau, Ph.D - Unimicron             43   Functionalized materials enable yield
      Leon Lin Tingyu, Ph.D - National Center for Advanced   improvement in package test
      Packaging (NCAP China)
                                                  By Jerry Broz, Bret Humphrey
      SUBSCRIPTION—INQUIRIES                      [International Test Solutions, Inc.]
      Chip Scale Review
      All subscription changes, additions, deletions to any
      and all subscriptions should be made by email only to
      subs@chipscalereview.com
                                               DEPARTMENTS

      Advertising Production Inquiries:      38 International Directory of Test & Burn-In
      Lawrence Michaels
      lmichaels@chipscalereview.com               Socket Manufacturers
 Featuring next-generation digital lithography technology   [Chip Scale Review]
 for high-volume manufacturing  Copyright © 2020 Haley Publishing Inc.
      Chip Scale Review (ISSN 1526-1344) is a registered trademark of
      Haley Publishing Inc. All rights reserved.
      Subscriptions in the U.S. are available without charge to qualified
 Combining high resolution with powerful digital processing   individuals in the electronics industry.  In the U.S. subscriptions by   49 Enhancing the quality and reliability of
      first class mail are $125 per year.  Subscriptions outside of the United
 to enable next-generation heterogeneous integration applications  States are $225 per year to other countries.  2.5D IC packages
      Chip Scale Review, (ISSN 1526-1344), is published six times a  By Sajay Bhuvanendran Nair Gourikutty, Lin Ji, Ratan
      year with issues in January-February, March-April, May-June, July-  Umralkar, Surya Bhattacharya
 Scalable solution accommodating R&D and HVM needs in one   August, September-October and November-December. Periodical  [A*STAR Institute of Microelectronics]
      postage paid at Los Angeles, Calif., and additional offices.
                                                  Xueren Zhang, Kok Keng Chua
 system without adding on footprint  POSTMASTER: Send address changes to Chip Scale Review magazine  [Xilinx Asia Pacific]
      P.O. Box 2165
      Morgan Hill, CA 95038
      Tel: +1-408-846-8580
 Addressing lithography needs for Advanced Packaging, MEMS,   Printed in the United States
 Biomedical and High-density PCB applications













 GET IN TOUCH to discuss your manufacturing needs
 www.EVGroup.com  EVG®  LITHOSCALE®
                                                       Chip Scale Review   November  •  December  •  2020   [ChipScaleReview.com]  3 3
   1   2   3   4   5   6   7   8   9   10