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INDUSTRY EVENTS

The 31st Semiconductor Wafer Test

(SWTest) Conference

By Jerry Broz [SWTest General Chair, and Advanced Probing Systems Inc]

T he Semiconductor Wafer

Test (SWTest) Conference
was held as a hybrid event
June 5–8, 2022, at the Omni La Costa in
Carlsbad, CA. The conference was a sold-
out, huge success! Now in its 31st year, the
conference is an annual event exclusively
focused on the complex challenges of
wafer-level test and probe technologies.
Building off the in-person and virtual
conference held in 2021, SWTest 2022
was a two-and-a-half-day hybrid event
with more than 525 registered domestic
and international attendees. Attending in-
person were 480 wafer test professionals,
with almost 80 technologists participating
via the virtual platform and OnDemand. Dr. Jerry Broz, SWTest General Chair, welcomes more than 500 combined on-site and virtual attendees to the
Benefitting from the relaxation of various sold-out 31st SWTest Conference and Expo that was held at the Omni La Costa in Carlsbad CA, June 5-8, 2022.
COVID travel restrictions, SWTest
welcomed approximately 30% of the Amkor Technology. Ms. Obregon-Jimenez performance computing (HPC), Internet of
attendees from the international Asian focused her presentation on “Advanced Things (IoT) and automotive applications.
and European test communities, many Packaging and Test Enabling Our Digital The technical program consisted of
of whom had not travelled in more than Society.” In her presentation, she explored 9 sessions that included 30 outstanding
18 months. In the grassroots spirit of innovations in advanced packaging and podium and poster technical presentations
the conference, attendees were able test technology that are the key catalysts addressing the key challenges faced by
to have face-to-face discussions with in our digital society driving 5G, high- probe technologists. Monday’s session on
peers, colleagues, and suppliers in a safe
environment with ample social distancing.
The conference included two invited,
live-st reamed visionar y key note
presentations that delved into the future
needs of test, test development, and the
requirements of the advanced packaging
roadmap. Starting with the Monday
morning plenary session, the first visionary
keynote presentation was made by John
Yi, who serves as an Engineering Fellow
at AMD. Mr. Yi discussed “Architecting
Test Solutions for the Next Generation of
Compute,” and provided deep insights for
the general compute roadmap, methods
of innovating new test solutions, and the
critical solutions that wafer probe test
will need going forward. On Tuesday, the
second visionary keynote presentation
was made by Rebeca Obregon-Jimenez of John Yi, Engineering Fellow at AMD, made a Visionary Keynote presentation at SWTest 2022 discussing the critical
solutions that wafer probe test needs going forward.

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42 Chip Scale Review July • August • 2022 [ChipScaleReview.com]