The Burn-in and Test Strategies (BiTS) Workshop held its 18th annual North American event March 5-8 in Mesa, AZ. The event was attended by more than 240 test engineers and managers from around the world, representing more than 100 companies including top foundries, fabless, and integrated device manufacturers and outsourced subassembly and test suppliers (OSATS), as well as suppliers of equipment and consumables to the semiconductor industry. In total, more than 400 people participated in this year’s event.
Thirty-two technical presentations were delivered by suppliers, end-users and engineering professionals. The presentations underscored the event’s theme of test fundamentals applied to leading edge applications legacy challenges. One of the event’s largest poster sessions reinforced the theme and highlighted related and contemporary topics.
The BiTS 2017 Awards went to the following:
|Best Presentation||"Contactor Based Final Test at 77 GHz on a Multi- Channel Radar Transceiver Chipset"||Brian Nakai & Jeffrey Finder – NXP Semiconductors|
|Best Data||"High Current Final Test Contactor Development"||Thiha Shwe & Hisashi Ata-Texas Instruments Kenichi Sato - Yokowo|
|Most Inspirational||“New Possibility with Coax Via Risers”||Matthew Priolo, Adrian Rodriquez, Christopher Kinney, & Adewale Oladeinde – Intel Corporation|
|Most Educational||"Flat Probe Technology For High Frequency Test"||Jason Mroczkowski & Nadia Steckler - Xcerra|
|Attendee Choice||"Coming to terms with Burn-In sockets"||James Tong - Texas Instruments|
|Best Poster||"Low Cost / Low Profile Spring Probe"||Samuel Pak - IWIN Co., Ltd.|
The ever-popular BiTS EXPO provided an opportunity for fifty-one companies to provide invaluable information to both attendees and visitors from the local technology community.
The BiTS technical program and exhibition are dedicated to providing a forum for sharing the latest information on a broad range of test topics including final/packaged part test, wafer sort, and burn-in. Attendees provided very positive feedback regarding the opportunities to meet, network, and explore current test ideas and challenges with other professionals who are focused on emerging test challenges.
Twin Solution Technology was the BiTS 2017 Premier Sponsor while Test Tooling Solutions Group continued its support as the Emeritus Sponsor.
“The strong on-going presence of an international group of professionals visiting BiTS underscores the strength of the workshop’s program,” said Ira Feldman, General Chairman for the Burn-in and Test Strategies workshop. “This year, over 36% of participants were international visitors to Mesa, AZ. And professional and overall participation was up by greater than 20% compared to last year. We believe there will also be an even greater growth in attendance when BiTS China returns to Shanghai this September.”
The BiTS Technical Committee comprises volunteers from across the industry and around the world. They represent companies who are interested in helping to shape the conference and the industry.